H. Mullejans et Rh. French, Insights into the electronic structure of ceramics through quantitative analysis of valence electron energy-loss spectroscopy, MICROS MICR, 6(4), 2000, pp. 297-306
Valence electron energy-loss (VEEL) spectroscopy was performed on six ceram
ic materials in a dedicated scanning transmission electron microscope (STEM
). Quantitative analysis of these data is described yielding access to the
complex optical properties and the electronic structure of the materials. C
omparisons are made on the basis of the interband transition strength descr
ibing transitions between occupied states in the valence band and empty sta
tes in the conduction band. This proves that the quantitative analysis of V
EEL data is a competitive and complementary method to be considered when in
vestigating the electronic structure of materials. Possibilities for improv
ement and extension of the analysis are discussed extensively.