Insights into the electronic structure of ceramics through quantitative analysis of valence electron energy-loss spectroscopy

Citation
H. Mullejans et Rh. French, Insights into the electronic structure of ceramics through quantitative analysis of valence electron energy-loss spectroscopy, MICROS MICR, 6(4), 2000, pp. 297-306
Citations number
58
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
MICROSCOPY AND MICROANALYSIS
ISSN journal
14319276 → ACNP
Volume
6
Issue
4
Year of publication
2000
Pages
297 - 306
Database
ISI
SICI code
1431-9276(200007/08)6:4<297:IITESO>2.0.ZU;2-6
Abstract
Valence electron energy-loss (VEEL) spectroscopy was performed on six ceram ic materials in a dedicated scanning transmission electron microscope (STEM ). Quantitative analysis of these data is described yielding access to the complex optical properties and the electronic structure of the materials. C omparisons are made on the basis of the interband transition strength descr ibing transitions between occupied states in the valence band and empty sta tes in the conduction band. This proves that the quantitative analysis of V EEL data is a competitive and complementary method to be considered when in vestigating the electronic structure of materials. Possibilities for improv ement and extension of the analysis are discussed extensively.