Characterization of amorphous materials by electron diffraction and atomistic modeling

Citation
Djh. Cockayne et al., Characterization of amorphous materials by electron diffraction and atomistic modeling, MICROS MICR, 6(4), 2000, pp. 329-334
Citations number
16
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
MICROSCOPY AND MICROANALYSIS
ISSN journal
14319276 → ACNP
Volume
6
Issue
4
Year of publication
2000
Pages
329 - 334
Database
ISI
SICI code
1431-9276(200007/08)6:4<329:COAMBE>2.0.ZU;2-H
Abstract
The technique of energy selected electron diffraction gives information abo ut amorphous structures which can be used to characterize amorphous materia ls in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonabl e models consistent with the diffraction data.