R. Tykva, Analysis of the surface technology of silicon detectors for imaging of low-energy beta tracers in biological material, NUCL INST A, 448(3), 2000, pp. 576-580
Using silicon surface barrier detectors, the counting sensitivity of low-en
ergy beta tracers is considerably influenced by surface technology applied
in detector manufacturing. Original diagnostic procedure, using a mixture o
f uranium fission products, is described to trace the behaviors of differen
t admixtures as in the etching bath as in the water used during development
of the detector surface. In combination with some other described analyses
, the detectors produced with the developed surface control are used in a P
C - controlled scanning equipment reaching at room temperature an FWHM of 3
.4 keV for Am-241. Such detectors make it possible to image distribution, o
f e.g., H-3, I-125, H-3 + C-14 and other beta tracer combinations applied i
n life and environmental sciences. (C) 2000 Elsevier Science B.V. All right
s reserved.