The structure study of thin cadmium and copper sulphide films by diffraction of synchrotron radiation

Crystalline structure and phase composition of thin CdS, Cu2S and Cd(Cu)S f ilms were investigated using diffraction of synchrotron radiation (SR). The se films were synthesized by RPECVD using nontraditional volatile sulphur-c ontaining precursors. The diffraction measurements were performed at the st ation "Anomalous Scattering", existed at the second canal of colliding elec tron-positron beam accelerator VEPP-3 of Siberian center of SR (Institute o f Nuclear Physics of SE RAS, Novosibirsk, Russia). It was established that these films have a high transmittance in the visible range of spectra. This type of substrate material was found to determine the structure of sulphid e films. The deviation of lattice parameters of cadmium and copper sulphide s in thin film state obtained on Si(100) substrates from following the para meters in bulk state probably connects with lattice mismatch of silicon sub strate and hexagonal structure of growing sulphide films. (C) 2000 Elsevier Science B.V. All rights reserved.