Defects in nanocrystalline Pd and submicrocrystalline Cu by EXAFS

Citation
Ya. Babanov et al., Defects in nanocrystalline Pd and submicrocrystalline Cu by EXAFS, NUCL INST A, 448(1-2), 2000, pp. 372-375
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
448
Issue
1-2
Year of publication
2000
Pages
372 - 375
Database
ISI
SICI code
0168-9002(20000621)448:1-2<372:DINPAS>2.0.ZU;2-U
Abstract
EXAFS spectra of nanocrystalline (nc) Pd and submicrocrystalline (smc) Cu a re presented, nc-Pd samples with a grain size of 15 nm have been prepared b y gas condensation technique, and submicrocrystalline Cu samples with a gra in size of 100 nm have been prepared by severe plastic deformation. EXAFS m easurements of powder nc-Pd samples with optimal thickness were performed u sing synchrotron radiation, and rolled smc-Cu by laboratory EXAFS spectrome ter, As a result of mathematical treatment, atomic density distribution fun ctions have been determined. The results obtained show that in comparison with coarse-grained crystallin e standards the decrease of the first neighbor coordination numbers N is 5- 6% for nc-Pd, and 3% for smc-Cu. For interpretation of the obtained results , the numerical simulation of the atomic structure with modelling to cut of f the bond lengths for grain boundary and to create vacancies during sample preparation is performed. (C) 2000 Elsevier Science B.V. All rights reserv ed.