PMMA-based resists for a spectral range near 13 nm

Citation
Sa. Bulgakova et al., PMMA-based resists for a spectral range near 13 nm, NUCL INST A, 448(1-2), 2000, pp. 487-492
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
448
Issue
1-2
Year of publication
2000
Pages
487 - 492
Database
ISI
SICI code
0168-9002(20000621)448:1-2<487:PRFASR>2.0.ZU;2-K
Abstract
A number of poly(meth)acrylates positive resists of various chemical struct ures were synthesized and the sensitivity of 0.2 mu m resists films to soft X-ray radiation of a laser plasma source at a wavelength of 13 nm was inve stigated. We found that the sensitivity of methylmethacrylate (MMA) copolym ers depending on the nature of comonomers changes within the limits of 12.3 -1.7 mJ/cm(2) in a combination with the contrast gamma = 5.4-1.0. This sens itivity is higher than that of PMMA, which changes from 12 to 45 mJ/cm(2) a t the contrast gamma = 2.6-8.0 depending on the developer composition of me thylethylketone (MEK)/isopropyl alcohol (IPA). (C) 2000 Elsevier Science B. V. All rights reserved.