V. Valiunas et R. Weingart, Electrical properties of gap junction hemichannels identified in transfected HeLa cells, PFLUG ARCH, 440(3), 2000, pp. 366-379
Human HeLa cells transfected with mouse connexin Cx30, Cx46 or Cx50 were us
ed to study the electrical properties of gap junction hemichannels. With no
extracellular Ca2+, whole-cell recording revealed currents arising from he
michannels. Multichannel currents showed a time-dependent inactivation sens
itive to voltage, V-m. Plots of the instantaneous conductance, g(hc.inst),
versus V-m were constant; plots of the steady-state conductance, g(hc,ss),
versus V-m were bell-shaped. Single-channel currents showed two conductance
s, gamma(hc,main) and Y-hc.residual, the latter congruent to 1/6 of the for
mer. Single-channel currents exhibited fast transitions (1-2 ms) between th
e main state and residual state. Late during wash-in and early during wash-
out of 2 mM heptanol, single-hemichannel currents showed slow transitions b
etween an open state and closed state. The open channel probabili ty, P-o,
was V-m-dependent. It declined from congruent to 1 at V-m = 0 mV to 0 at la
rge V-m of either polarity. Hemichannel currents showed a voltage-dependent
gamma(hc,main), i.e., it increased/decreased with hyperpolarization/depola
rization. Extrapolation to V-m=0 mV led to a gamma(hc,main) of 283, 250 and
352 pS for Cx30, Cx46 and Cx50, respectively. The hemichannels possess two
gating mechanisms. Gating with positive voltage reflects V-j-gating of gap
junction channels, gating with negative voltage reflects a property inhere
nt to hemichannels, i.e., V-m or "loop" gating. We conclude that Cx30, Cx46
and Cx50 form voltage-sensitive hemichannels in single cells which are clo
sed under physiological conditions.