X-ray topography investigation of La2-xSrxCuO4 single crystals

La2-xSrxCuO4 (LSCO) single crystals have been studied by X-ray topography m ethods. Particularities of grain structure connected with the growth method s travelling solvent floating zone (TSFZ) and slow cooling (SC) are explore d. It was found that average disorientation between grains for the TSFZ met hod is 0.3-0.3 degrees. For the SC method, the disorientation varies from 0 .01-0.03 degrees up to 0.3 degrees depending on cooling rate. It was shown that TSFZ grown LSCO single crystals are more preferable as substrates for liquid phase epitaxy technique. (C) 1000 Elsevier Science B.V. All rights r eserved.