Fw. Bentrem et al., Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains, PHYS REV E, 62(1), 2000, pp. 914-917
Growth and roughness of the interface of deposited polymer chains driven by
a field onto an impenetrable adsorbing surface are studied by computer sim
ulations in (2 + 1) dimensions. The evolution of the interface width W show
s a crossover from short-time growth described by the exponent beta(1) to a
long-time growth with exponent beta(2) (>beta(1)) Tne saturated width incr
eases, i.e., the interface roughens, with the molecular weight L-c, but the
roughness exponent alpha (from W-s similar to L-alpha) becomes negative in
contrast to models for particle deposition; cr depends on the chain length
-a nonuniversal scaling with the substrate length L. Roughening and derough
ening occur as the field E and the temperature T compete such that W-s appr
oximate to (A+BT)E-1/2.