Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains

Citation
Fw. Bentrem et al., Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains, PHYS REV E, 62(1), 2000, pp. 914-917
Citations number
26
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW E
ISSN journal
1063651X → ACNP
Volume
62
Issue
1
Year of publication
2000
Part
B
Pages
914 - 917
Database
ISI
SICI code
1063-651X(200007)62:1<914:RDANSO>2.0.ZU;2-I
Abstract
Growth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer sim ulations in (2 + 1) dimensions. The evolution of the interface width W show s a crossover from short-time growth described by the exponent beta(1) to a long-time growth with exponent beta(2) (>beta(1)) Tne saturated width incr eases, i.e., the interface roughens, with the molecular weight L-c, but the roughness exponent alpha (from W-s similar to L-alpha) becomes negative in contrast to models for particle deposition; cr depends on the chain length -a nonuniversal scaling with the substrate length L. Roughening and derough ening occur as the field E and the temperature T compete such that W-s appr oximate to (A+BT)E-1/2.