Determination of spherosiloxane cluster bonding to Si(100)-2 x 1 by scanning tunneling microscopy

Authors
Schneider, KS Zhang, Z Holl, MMB Orr, BG Pernisz, UC
Citation
Ks. Schneider et al., Determination of spherosiloxane cluster bonding to Si(100)-2 x 1 by scanning tunneling microscopy, PHYS REV L, 85(3), 2000, pp. 602-605
Citations number
13
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
85
Issue
3
Year of publication
2000
Pages
602 - 605
Database
ISI
SICI code
0031-9007(20000717)85:3<602:DOSCBT>2.0.ZU;2-Q
Abstract
Scanning tunneling microscopy is used to determine the bonding geometry of the spherosiloxane cluster, H8Si8O12, on Si(100)-2 x 1. The images obtained are consistent with monovertex bonding to the Si(100)-2 x 1 surface via ac tivation of a single Si-H bond. Filled and empty state images show good agr eement with calculations of the electron density distribution of the cluste r as well as the Psi(2) highest occupied molecular orbital and lowest unocc upied molecular orbital surface plots of the cluster.