Comparison of the pH sensitivity of different surfaces on tantalum pentoxide

Citation
Jc. Chou et Cn. Hsiao, Comparison of the pH sensitivity of different surfaces on tantalum pentoxide, SENS ACTU-B, 65(1-3), 2000, pp. 237-238
Citations number
4
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS B-CHEMICAL
ISSN journal
09254005 → ACNP
Volume
65
Issue
1-3
Year of publication
2000
Pages
237 - 238
Database
ISI
SICI code
0925-4005(20000630)65:1-3<237:COTPSO>2.0.ZU;2-L
Abstract
In this study, we have observed the roughness of the surfaces of amorphous tantalum pentoxide (a-Ta2O5) using Atomic Force Microscopy. The elecrrolyte -oxide-semiconductor (EOS) structure of a-Ta2O5/SiO2/p-Si/Al which was imme rsed in the different buffer solutions (pH = 1-pH = 13) measured the capaci tance and calculated the pH-sensitivity of a-Ta2O5 of the different reactin g pressures. Furthermore, the relationship between the roughness of the sur face and the pH-sensitivity of a-Ta2O5 is presented in this paper. (C) 2000 Elsevier Science S.A. All rights reserved.