Hd. Bellamy et al., The high-mosaicity illusion: revealing the true physical characteristics of macromolecular crystals, ACT CRYST D, 56, 2000, pp. 986-995
Typical measurements of macromolecular crystal mosaicity are dominated by t
he characteristics of the X-ray beam and as a result the mosaicity value gi
ven during data processing can be an artifact of the instrumentation rather
than the sample. For physical characterization of crystals, an experimenta
l system and software have been developed to simultaneously measure the dif
fraction resolution and mosaic spread of macromolecular crystals. The contr
ibutions of the X-ray beam to the reflection angular widths were minimized
by using a highly parallel, highly monochromatic synchrotron source. Hundre
ds of reflection profiles over a wide resolution range were rapidly measure
d using a charge-coupled device (CCD) area detector in combination with sup
erfine phi-slicing data collection. The Lorentz effect and beam contributio
ns were evaluated and deconvoluted from the recorded data. Data collection
and processing is described. From 1 degrees of superfine phi-slice data col
lected on a crystal of manganese superoxide dismutase, the mosaicities of 2
60 reflections were measured. The average mosaicity was 0.0101 degrees (s.d
. 0.0035 degrees) measured as the full-width at half-maximum (FWHM) and ran
ged from 0.0011 to 0.0188 degrees. Each reflection profile was individually
fitted with two Gaussian profiles, with the first Gaussian contributing 55
% (s.d. 9%) and the second contributing 35% (s.d. 9%) of the reflection. On
average, the deconvoluted width of the first Gaussian was 0.0054 degrees (
s.d. 0.0015 degrees) and the second was 0.0061 degrees (s.d. 0.0023 degrees
). The mosaicity of the crystal was anisotropic, with FWHM values of 0.0068
, 0.0140 and 0.0046 degrees along the a, b and c axes, respectively. The an
isotropic mosaicity analysis indicates that the crystal is most perfect in
the direction that corresponds to the favored growth direction of the cryst
al.