Ig. Eustatiu et al., Generalized oscillator strengths for inner-shell excitation of SF6 recorded with a high-performance electron energy loss spectrometer, CHEM PHYS, 257(2-3), 2000, pp. 235-252
The generalized oscillator strength profiles for S 2p, S 2s and F Is excite
d and ionized states of sulfur hexafluoride (SF6) are reported up to very h
igh momentum transfer. These have been measured with a variable impact ener
gy, variable scattering angle electron energy loss spectrometer, which is d
edicated to studies of electric dipole (optically allowed) and non-dipole (
optically forbidden electric quadrupole and spin-exchange) inner shell elec
tronic transitions of gases, and systematic measurements of their angular a
nd impact energy distributions in order to derive generalized oscillator st
rength profiles. In addition to presenting the SF6 results, we describe the
design, construction and performance of the instrument, as well as data ac
quisition and analysis procedures. (C) 2000 Published by Elsevier Science B
.V. All rights reserved.