A theoretical treatment of void electromigration in the strip geometry

Authors
Ben Amar, M Cummings, LJ Richardson, G
Citation
M. Ben Amar et al., A theoretical treatment of void electromigration in the strip geometry, COMP MAT SC, 17(2-4), 2000, pp. 279-289
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
COMPUTATIONAL MATERIALS SCIENCE
ISSN journal
09270256 → ACNP
Volume
17
Issue
2-4
Year of publication
2000
Pages
279 - 289
Database
ISI
SICI code
0927-0256(200006)17:2-4<279:ATTOVE>2.0.ZU;2-Q
Abstract
The void electromigration process in the strip geometry is investigated ana lytically and numerically. The void is assumed to travel either along the a xis of symmetry of the metal strip or at the boundary. In each case, the sh ape, the velocity of the void and the characteristic electrical current are predicted. (C) 2000 Published by Elsevier Science B.V. All rights reserved .