Reversal modes and reversal times in submicron sized elements for MRAM applications

Citation
T. Schrefl et J. Fidler, Reversal modes and reversal times in submicron sized elements for MRAM applications, COMP MAT SC, 17(2-4), 2000, pp. 490-495
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
COMPUTATIONAL MATERIALS SCIENCE
ISSN journal
09270256 → ACNP
Volume
17
Issue
2-4
Year of publication
2000
Pages
490 - 495
Database
ISI
SICI code
0927-0256(200006)17:2-4<490:RMARTI>2.0.ZU;2-V
Abstract
The switching behavior of submicron sized NiFe nanoelements was calculated using a hybrid finite element/boundary element method. The numerical integr ation of the Gilbert equation of motion reveals the transient states during magnetization reversal under the influence of a constant applied field. Th e reversal mode and the reversal time sensitively depend on the size and th e shape of the elements. The 200 x 100 x 10 nm(3) elements switch well belo w 1 ns for an applied field of 80 kA/m and a Gilbert damping constant alpha = 0.1. The elements reverse by non-uniform rotation. If an external field is applied the magnetization starts to rotate near the ends, followed by th e reversal of the center. This process requires only about 0.1 ns. In what follows, the magnetization component parallel to the field direction shows oscillations. which decay within a time of 0.4 ns. The excitation of spin w aves is caused by the precession of the magnetization around the local effe ctive field. A rapid decay of the oscillations is obtained in elements with slanted ends, where surface charges cause a transverse demagnetizing field . (C) 2000 Elsevier Science B.V. All rights reserved.