Far infrared (FIR) soft-mode dielectric responses of bulk SrTiO3 single cry
stal, flux-grown plate-like crystal, bulk ceramics and several thin films i
n the 10-300 K range are measured and compared. Huge differences among the
samples are observed, particularly below the antiferrodistortive transition
, where the soft mode frequency in films and ceramics levels off near simil
ar to 60 cm(-1). The reason for it is connected mainly with internal stress
es induced by the transition, however quantitative estimates are missing. S
oft mode spectroscopy is shown to be extremely sensitive to the quality of
the film.