C. Schuster et W. Fichtner, Signal integrity analysis of interconnects using the FDTD method and a layer peeling technique, IEEE ELMAGN, 42(2), 2000, pp. 229-233
Citations number
13
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
This paper presents the application of an impedance layer peeling technique
to network parameter extraction from finite-difference time-domain (FDTD)
simulations. It is shown that the combination of both methods offers a simp
le and efficient may to analyze lossless linear 1- or 2-port structures. Th
e extraction of equivalent circuit models can be done entirely in the time
domain and the optimization of lumped element parameters is not necessary.
Special attention is paid to the problem of injecting voltage steps with sh
ort risetimes into the FDTD grid. Results obtained with this technique are
compared to network analyzer measurements and usual FDTD annlysis based on
scattering parameter extraction.