Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility

Authors
Jones, R Chugg, AM Jones, CMS Duncan, PH Dyer, CS Sanderson, C
Citation
R. Jones et al., Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility, IEEE NUCL S, 47(3), 2000, pp. 539-544
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
47
Issue
3
Year of publication
2000
Part
1
Pages
539 - 544
Database
ISI
SICI code
0018-9499(200006)47:3<539:CBSSCF>2.0.ZU;2-R
Abstract
A new pulsed laser facility has been developed to extend laser testing tech niques to generate upset cross-section curves. The objective has been to es tablish an economical laser-based bulk screening capability for SEE suscept ibility.