Application of a pulsed laser for evaluation and optimization of SEU-hard designs

Pulsed laser single-event upset tests are used to pinpoint and characterize sensitive nodes of circuits and to provide feedback relevant to the develo pment and optimization of radiation-hard designs. The results presented rev eal the advantages of incorporating laser evaluation at an early stage into programs designed for the development of radiation-hardened parts. A quant itative correlation is observed between the laser single-event upset and si ngle-event latchup threshold measurements and those performed using acceler ator-based heavy ion testing methods.