Dynamic scanning force microscopy at low temperatures

In this paper, we review the design and various applications of a low tempe rature scanning force microscope for ultrahigh vacuum. It has been adopted for dynamic mode measurements, a powerful method to image surfaces with a r esolution similar to scanning tunneling microscopy, but without the limitat ion to conducting materials. With this instrument, we have studied semicond ucting (InAs), conducting (HOPG) and insulating samples (xenon thin film). Finally, we discuss a new experimental method to determine the tip-sample i nteraction with high accuracy.