High-resolution examination of recording marks in phase-change media usinga scanning near-field optical microscope

Citation
T. Tadokoro et al., High-resolution examination of recording marks in phase-change media usinga scanning near-field optical microscope, JPN J A P 1, 39(6A), 2000, pp. 3599-3602
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
6A
Year of publication
2000
Pages
3599 - 3602
Database
ISI
SICI code
Abstract
Recording marks in digital versatile disc-random access memory (DVD-RAM) we re examined using a scanning near-field optical microscope (SNOM) incorpora ting an improved probe tip design. The marks were recorded on an experiment al DVD-RAM medium with a track-pitch of 0.6 mu m. The tip size of the SNOM was made wider than the track width in order tb avoid optical ghosting aris ing from the track edge. The recording power was varied in order to investi gate the dependence of the mark shape on power and it was found that the ma rk shape correlated well with the reproduced signal. The SNOM is considered -to be a good candidate for a practical characterization tool for optical r ecording media.