A technique for the measurement of diffuse X-ray scattering on individual r
eciprocal-space planes using high-energy X-ray photons is described. The me
thod is demonstrated using a disordered crystal of the compound TlSbOGeO4 a
nd compared to data collected with a sealed-tube Cu anode source. Measureme
nts were made on a synchrotron undulator beamline at an energy of 45 keV us
ing Weissenberg flat-cone geometry and a storage phosphor (image) plate to
detect the scattered X-rays. Advantages of the method include: extension of
the accessible diffraction space to both higher and lower wavevectors, the
ability to use crystals of irregular shape without the need for complicate
d absorption corrections, less need to prepare sample surfaces carefully, a
nd the ability to filter fluorescence simply.