High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry

A technique for the measurement of diffuse X-ray scattering on individual r eciprocal-space planes using high-energy X-ray photons is described. The me thod is demonstrated using a disordered crystal of the compound TlSbOGeO4 a nd compared to data collected with a sealed-tube Cu anode source. Measureme nts were made on a synchrotron undulator beamline at an energy of 45 keV us ing Weissenberg flat-cone geometry and a storage phosphor (image) plate to detect the scattered X-rays. Advantages of the method include: extension of the accessible diffraction space to both higher and lower wavevectors, the ability to use crystals of irregular shape without the need for complicate d absorption corrections, less need to prepare sample surfaces carefully, a nd the ability to filter fluorescence simply.