Growth and characterization of poly(arylamine) thin films prepared by vapor deposition

Citation
Gj. Szulczewski et al., Growth and characterization of poly(arylamine) thin films prepared by vapor deposition, J VAC SCI A, 18(4), 2000, pp. 1875-1880
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
4
Year of publication
2000
Part
2
Pages
1875 - 1880
Database
ISI
SICI code
0734-2101(200007/08)18:4<1875:GACOPT>2.0.ZU;2-6
Abstract
Thin films of new organic redox-active arylamine dendrimers have been exami ned. The thermal properties of the bulk samples have been measured by diffe rential scanning calorimetry and thermogravimetric analysis. In general, th ese compounds exhibit amorphous phases with glass transition temperatures n ear 100 degrees C and are thermally stable up to 400 degrees C. Thin films (1-100 nm) of these large (1300-2200 amu) molecules were prepared by vapor deposition onto Au and Si(100) surfaces. Nuclear magnetic resonance analysi s of redissolved films proved that vapor deposition occurs without molecula r decomposition. Ex situ surface characterization was performed by reflecti on-absorption infrared spectroscopy, x-ray photoelectron spectroscopy, spec troscopic ellipsometry, and atomic-force microscopy to document the chemica l integrity and morphology of the films. The analyses show that the vapor d eposition produces molecularly smooth dendrimer films at high surface cover ages, while at low surface coverage, film growth and morphology depend grea tly on the chemical nature of the surface. (C) 2000 American Vacuum Society . [S0734-2101(00)05004-1].