We demonstrate an apparatus for measuring time-dependent x-ray diffrac
tion. X-ray pulses from a synchrotron are diffracted by a pair of Si(1
11) crystals and detected with an x-ray streak camera that has single-
shot resolution of better than 1 ps. The streak camera is driven by a
photoconductive su itch, which is triggered by 100-fs laser pulses at
a repetition rate of 1 kHz. The laser and the streak camera are synchr
onized with the synchrotron pulses. In the averaging mode, trigger jit
ter results in 2-ps temporal resolution. We measured the duration of 5
-keV pulses from the Advanced Light Source synchrotron to be 70 ps. (C
) 1997 Optical Society of America.