Investigation of beam deflection reduction and multi-beamlet focus at a large-area negative ion source for a neutral beam injector with 3-D beam trajectory simulation
M. Tanaka et al., Investigation of beam deflection reduction and multi-beamlet focus at a large-area negative ion source for a neutral beam injector with 3-D beam trajectory simulation, NUCL INST A, 449(1-2), 2000, pp. 22-35
We investigated the reduction of ion beam deflection caused by electron def
lection magnets, and focus of multi-beamlets at a large-area negative ion s
ource of a neutral beam injector (NBI) in order to reduce beam loss during
long-distance beam transport ( > 10 m) and beam injection into a nuclear fu
sion device. The electrostatic lens effect by displacement of the beam extr
action aperture of a grounded grid (GG) was utilized for the beam deflectio
n reduction and the multi-beamlet focus. We proposed an analysis process to
adjust: the aperture displacement which avoids beam collision with the GG
by too much displacement. The analysis process includes a 3-D beam trajecto
ry simulation used for analyzing the beam deflection angle and beam radius
as well as theoretical calculations, which are used to calculate the apertu
re displacement based on the 3-D simulation results. Applicability of the a
nalysis process was examined for a large-area high-current H- ion source of
an NBI (0.25 m x 1.25 m, 40 A, 180 keV). The analysis process was proved t
o be useful for adjusting the GG aperture displacement and ion source param
eters (acceleration gap length y(acc), extraction voltage V-ext, etc.) so a
s to reduce the beam deflection and to focus the multi-beamlets avoiding be
am collision with the GG, 3-D simulation results were compared with the exp
erimental results of the H- ion source to confirm validity of the analysis
process. The beam deflection angle was reduced to almost zero in the simula
tion with a displacement equal to the experiment. This simulation result wa
s consistent with the experimental results. The analysis process will allow
design work of future negative ion sources to be speeded up, with a minimu
m of experimental work. (C) 2000 Published by Elsevier Science B.V. All rig
hts reserved.