High-precision ionization chamber for relative intensity monitoring of synchrotron radiation

Authors
Ahmed, SN Besch, HJ Walenta, AH Pavel, N Schenk, W
Citation
Sn. Ahmed et al., High-precision ionization chamber for relative intensity monitoring of synchrotron radiation, NUCL INST A, 449(1-2), 2000, pp. 248-253
Citations number
5
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
449
Issue
1-2
Year of publication
2000
Pages
248 - 253
Database
ISI
SICI code
0168-9002(20000711)449:1-2<248:HICFRI>2.0.ZU;2-B
Abstract
A single channel, high-precision ionization chamber has been built for moni toring the relative intensity of X-rays in the energy range above 5 keV. It can be used in experiments, such as EXAFS, where simultaneous high-precisi on monitoring of the relative intensity during the actual experiment is req uired. In this paper the construction of the chamber and its performance du ring test measurements with an X-ray tube are presented. (C) 2000 Elsevier Science B.V. All rights reserved.