Single Al-Pd-Re icosahedral quasicrystals with a maximum diameter of 5 mm h
ave been grown by a slow cooling method on the basis of a partial phase dia
gram determined in the present study. Laue X-ray and electron diffraction v
erified the highly ordered structure of the single icosahedral quasicrystal
s. The electrical resistivity p of the single quasicrystals was measured to
be 2000-4000 mu Omega cm at 300K and 3000-6000 mu Omega cm at 2K, revealin
g a negative temperature dependence with a rho(4.2K)/rho(300K) value smalle
r than 2.