Atomically resolved edges and kinks of NaCl islands on Cu(111): Experimentand theory

Citation
R. Bennewitz et al., Atomically resolved edges and kinks of NaCl islands on Cu(111): Experimentand theory, PHYS REV B, 62(3), 2000, pp. 2074-2084
Citations number
50
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
3
Year of publication
2000
Pages
2074 - 2084
Database
ISI
SICI code
0163-1829(20000715)62:3<2074:AREAKO>2.0.ZU;2-K
Abstract
Atomically resolved dynamic force microscopy (DFM) images of step and kink sites of NaCl films grown on the Cu(111) surface are presented. Combining e xperimental results with an atomistic modeling of DFM imaging, we study the mechanism of contrast formation and extract more information about the tip and NaCl film structure. The experimental results and theoretical modeling systematically demonstrate the enhanced interaction of step and kink sites of one kind with the tip. This is explained by the enhanced gradient of th e electrostatic potential at low-coordinated surface sites, and considerabl e displacements of the step edge and kink atoms from their sites due to the interaction with the tip upon approach. The theoretical analysis predicts that the silicon tip is effectively an insulator, and that the NaCl island cannot be thicker than two monolayers. We discuss the shape and chemical st ructure of the tip and the mechanism of damping during DFM imaging.