Atomically resolved dynamic force microscopy (DFM) images of step and kink
sites of NaCl films grown on the Cu(111) surface are presented. Combining e
xperimental results with an atomistic modeling of DFM imaging, we study the
mechanism of contrast formation and extract more information about the tip
and NaCl film structure. The experimental results and theoretical modeling
systematically demonstrate the enhanced interaction of step and kink sites
of one kind with the tip. This is explained by the enhanced gradient of th
e electrostatic potential at low-coordinated surface sites, and considerabl
e displacements of the step edge and kink atoms from their sites due to the
interaction with the tip upon approach. The theoretical analysis predicts
that the silicon tip is effectively an insulator, and that the NaCl island
cannot be thicker than two monolayers. We discuss the shape and chemical st
ructure of the tip and the mechanism of damping during DFM imaging.