The temperature dependence of the resistance R (T) of ultrathin quench-cond
ensed films of Ag, Bi, Pb, and Pd has been investigated. In the most resist
ive films, R (T) = R-0 exp(T-0 /T)(x), where x = 0.75 +/- 0.05. Surprisingl
y, the exponent x was found to be constant for a wide range of Ro and To in
all four materials, possibly implying a consistent underlying conduction m
echanism. The results are discussed in terms of several different models of
hopping conduction.