Secondary ion mass spectrometric investigation on ruthenium oxide systems:a comparison between poly- and nanocrystalline deposits

Citation
S. Barison et al., Secondary ion mass spectrometric investigation on ruthenium oxide systems:a comparison between poly- and nanocrystalline deposits, RAP C MASS, 14(14), 2000, pp. 1179-1183
Citations number
27
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
RAPID COMMUNICATIONS IN MASS SPECTROMETRY
ISSN journal
09514198 → ACNP
Volume
14
Issue
14
Year of publication
2000
Pages
1179 - 1183
Database
ISI
SICI code
0951-4198(2000)14:14<1179:SIMSIO>2.0.ZU;2-G
Abstract
The influence of different RuO2 crystallite sizes was investigated by secon dary ion mass spectrometry (SIMS) on the oxide deposited on various support materials (Ni, Ti, Al2O3, oxidized Si(100)), In order to examine the effec t of an oxidic environment on the him structure, RuO2 20 % -TiO2 80% at. mi xed oxide was deposited on Ti, The polycrystalline coatings were prepared b y heating the Ru (and Ti)-containing solution dropped on the supports.(1) R uO2 nanocrystalline coatings were grown by chemical vapor deposition (CVD) from Ru(COD)(eta(3)-allyl)(2).(2) The identification of mixed oxide cluster s showed the higher reactivity of Ni and Al2O3 over the other substrates, D iffusion and migration characteristics were observed to be influenced by th e nature of the support. The results are complementary to those of a previo us SIMS investigation.(3) Copyright (C) 2000 John Wiley & Sons, Ltd.