Statistical process control using two measurement systems

Authors
Citation
Sh. Steiner, Statistical process control using two measurement systems, TECHNOMET, 42(2), 2000, pp. 178-187
Citations number
6
Categorie Soggetti
Mathematics
Journal title
TECHNOMETRICS
ISSN journal
00401706 → ACNP
Volume
42
Issue
2
Year of publication
2000
Pages
178 - 187
Database
ISI
SICI code
0040-1706(200005)42:2<178:SPCUTM>2.0.ZU;2-F
Abstract
Often in industry, critical quality characteristics can be measured by more than one measurement system. Typically, in such a situation, there is a fa st but relatively inaccurate measurement system that may be used to provide some initial information and a more accurate and expensive, and possibly s lower, alternative measurement device. In such circumstances, it is desirab le to determine the minimum cost-control chart for monitoring the productio n process using some combination of the measurement systems. This article d evelops such a procedure. An example of its use in the automotive industry is provided.