Improved growth and perpendicular anisotropy in Pd-Co multilayers with intentionally alloyed layers

Citation
P. Poulopoulos et al., Improved growth and perpendicular anisotropy in Pd-Co multilayers with intentionally alloyed layers, THIN SOL FI, 371(1-2), 2000, pp. 225-230
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
371
Issue
1-2
Year of publication
2000
Pages
225 - 230
Database
ISI
SICI code
0040-6090(20000801)371:1-2<225:IGAPAI>2.0.ZU;2-V
Abstract
Polycrystalline Pd-m-[CoPd](n), multilayers were grown by e-beam evaporatio n on polyimide, Si and glass substrates. The number of Pd atomic layers in one multilayer period was m approximate to 15 while the number n, of the al loyed layers ranged between 2 and 6. Transmission electron microscopy exper iments confirmed the excellent multilayer growth. The grain size of the cry stals was determined to be 10-30 nm. No columnar growth was observed. Super Conducting Quantum Interference Device (SQUID) magnetometry at temperature s of 10-300 K revealed a large perpendicular magnetic anisotropy with a squ areness ratio of approximately 1 for all thicknesses. The film with the thi nnest magnetic layers presented a reduced remanence at room temperature, wh ich is attributed to the formation of ferromagnetic domains near the Curie temperature. (C) 2000 Elsevier Science S.A. All rights reserved.