Physical properties of vanadium pentoxide sol gel films

Citation
Zs. El Mandouh et Ms. Selim, Physical properties of vanadium pentoxide sol gel films, THIN SOL FI, 371(1-2), 2000, pp. 259-263
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
371
Issue
1-2
Year of publication
2000
Pages
259 - 263
Database
ISI
SICI code
0040-6090(20000801)371:1-2<259:PPOVPS>2.0.ZU;2-I
Abstract
Vanadium pentoxide films were prepared by an inorganic sol-gel method. Opti cal absorption study of V2O5 yielded a direct band gap of 2.4 eV. The tempe rature coefficient of resistance, beta(tau) was 2% K-1 which indicated that V2O5, could be used as a resistor. The thermoelectric power showed n-type semi-conduction. Thr small changes in the Seebeck coefficient indicated sui tability as a thermistor. The activation energies calculated from the first heating-cooling cycle, were 0.1 and 0.37 eV, which indicated two types of conduction. X-Ray diffraction of V2O5 films showed the three characteristic peaks at 'd' spacing of 0.34, 0.27 and 0.217 nm. Annealing at 573 and 673 K improved the crystallinity of the films and decreased the localized state s in the band gap. (C) 2000 Published by Elsevier Science S.A. All rights r eserved.