Influence of deposition conditions on the structural characteristics of sublimated CdTe thin films

In this paper the results obtained by X-ray diffraction studies on the stru ctural characteristics of CdTe thin films deposited onto glass substrates b y close-spaced sublimation technique are presented. Using different experim ental arrangements and appropriate settings for growth parameters, the film s with different polycrystalline structures were prepared. The geometry and the volume of the deposition chamber influence the size of film crystallit es and also their preferential orientation, The role of deposition paramete rs such as the substrate temperature, the incidence angle, the film thickne ss, and the heat treatment in determination of the structural properties of the films are also investigated.