Depth profiling the thermal reflection coefficient of an opaque solid via an inverse thermal wave scattering theory based on the Method of Images

Citation
J. Karanicolas et al., Depth profiling the thermal reflection coefficient of an opaque solid via an inverse thermal wave scattering theory based on the Method of Images, APP PHYS B, 71(2), 2000, pp. 217-223
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS B-LASERS AND OPTICS
ISSN journal
09462171 → ACNP
Volume
71
Issue
2
Year of publication
2000
Pages
217 - 223
Database
ISI
SICI code
0946-2171(200008)71:2<217:DPTTRC>2.0.ZU;2-S
Abstract
A new formulation of the inverse problem of depth profiling the thermal pro perties of an opaque solid based on one-dimensional photo-generated thermal waves is presented. The inverse problem as posed is linear in a set of lum ped thermal reflection coefficients which account for the return of energy to the surface by all significant heat conduction channels. an analysis bas ed on the Method of Images relates these coefficients to individual values of the interface thermal reflection coefficients in the material. No weak b ackscattering assumption is invoked to linearize the problem. The method yi elds a unique solution subject to a given condition of regularization. Solu tions recovered by the method are stable at experimentally feasible error l evels.