Ad. Vasilyev et An. Bekrenev, Influence of free surface and interfaces on diffusion coefficients in Pd-Ag and Pd-Au polycrystalline thin films systems, APPL SURF S, 161(1-2), 2000, pp. 14-19
The influence of the interfaces on the diffusion in Pd films of Pd-Ag and P
d-Au polycrystalline systems at a temperature near 500 K was studied. An X-
ray diffraction technique based on the analysis of the profile change of li
ne (111) in the diffusion zone was used. The decrement of the diffusion coe
fficient in Pd film under transition from Pd-Ag-glass and Pd-Au-glass struc
ture to Ag-Pd-glass and Au-Pd-glass structure was established. This result
is explained by the influence of interphase surfaces on the mobility of dis
locations along which the diffusion happens. (C) 2000 Elsevier Science B.V.
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