Growth and microstructure of MgO thin films on Si(100) substrates by metal-organic molecular beam epitaxy

Citation
F. Niu et al., Growth and microstructure of MgO thin films on Si(100) substrates by metal-organic molecular beam epitaxy, APPL SURF S, 161(1-2), 2000, pp. 74-77
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
161
Issue
1-2
Year of publication
2000
Pages
74 - 77
Database
ISI
SICI code
0169-4332(200007)161:1-2<74:GAMOMT>2.0.ZU;2-F
Abstract
thin films have been grown on Si(100) substrates at low temperatures of 500 -850 degrees C by metal-organic molecular beam epitaxy (MOMBE) using the so lid precursor magnesium acetylacetonate. Oxygen plasma is required to achie ve deposition. The composition of the films was determined by Auger electro n spectroscopy (AES). The as-deposited films are phase-pure, stoichiometric , crystalline MgO with a [100] texture. Carbon contamination of the film re sulting from precursor decomposition was not observed within detection limi ts. The deposition rate depended superlinearly on the plasma source power. (C) 2000 Elsevier Science B.V. All rights reserved.