Atomic Force Microscopy (AFM), a recently developed technique, has proved t
o be a specially useful tool to characterise different types of material su
rfaces. In this work, we have used AFM to achieve a complete surface charac
terisation of several microfiltration membranes. These membranes are obtain
ed by the track-etching method and, consequently, they are very suitable as
test membranes, as having a very simple porous structure. For these membra
nes, several interesting structural parameters have been studied, as: poros
ity, pore size distributions and surface roughness of the membrane samples.
All these parameters, conveniently analysed, have been compared with resul
ts obtained from other complementary characterisation techniques, to assure
the realiability and validity of the obtained results. Important informati
on on the membrane samples structure has been obtained. in that sense has b
een determined a clear asymmetry between both membrane sides, asymmetry tha
t tan be attributed to the manufacture process itself.