Electron yield per ion charge-state correction for an ion collector with unsuppressed secondary electron emission

Citation
J. Krasa et al., Electron yield per ion charge-state correction for an ion collector with unsuppressed secondary electron emission, CZEC J PHYS, 50(7), 2000, pp. 797-802
Citations number
12
Categorie Soggetti
Physics
Journal title
CZECHOSLOVAK JOURNAL OF PHYSICS
ISSN journal
00114626 → ACNP
Volume
50
Issue
7
Year of publication
2000
Pages
797 - 802
Database
ISI
SICI code
0011-4626(200007)50:7<797:EYPICC>2.0.ZU;2-Z
Abstract
The electron yield per ion charge-state gamma/q was measured for emission o f electrons from clean polycrystalline gold induced due to impact of Taq+ ( 11 less than or equal to q less than or equal to 41) ions with kinetic ener gy per charge E-i/q from 15 keV/q to 150 keV/q. The dependence of gamma on angle of incidence was analyzed with use of relation gamma(theta) = gamma(0 ) cos(-f) theta. The fitting of experimental data gives a range of gamma(0) /q from 1 to 1.75 for Ta13+ and from 1.5 to 1.73 for Ta39+. The dependence of gamma(0)/q on q and E-i is discussed with respect to measurement of ion currents emitted from laser-produced plasmas with an ion collector with uns uppressed secondary electron emission.