Can macroscopic oxide thickness uniformity improve oxide reliability?

Citation
Ey. Wu et al., Can macroscopic oxide thickness uniformity improve oxide reliability?, IEEE ELEC D, 21(8), 2000, pp. 402-404
Citations number
13
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
21
Issue
8
Year of publication
2000
Pages
402 - 404
Database
ISI
SICI code
0741-3106(200008)21:8<402:CMOTUI>2.0.ZU;2-Y
Abstract
In this work, we investigated both experimentally and numerically the impac t of macroscopic oxide thickness uniformity on Weibull breakdown characteri stics for both Weibull parameters, namely, the characteristics times (T-63) and Weibull slopes (beta) over a wide range of oxide thickness. A detailed full scale Monte Carlo analysis is used to examine the breakdown character istics at low-percentile and its sensitivity to variation of thickness depe ndence of time-to-breakdown and Weibull slopes. We show that for thinner ox ides with very shallow Weibull slopes the impact of thickness variation is drastically reduced as compared to thicker oxides for the same parameters.