Analysis for charged spacers in FED

Citation
Ys. Choi et al., Analysis for charged spacers in FED, IEEE DEVICE, 47(8), 2000, pp. 1673-1677
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
47
Issue
8
Year of publication
2000
Pages
1673 - 1677
Database
ISI
SICI code
0018-9383(200008)47:8<1673:AFCSIF>2.0.ZU;2-3
Abstract
Charged spacers in the field emission display (FED) ale analyzed with the M onte Carlo method, The spacer is made of an insulator, which has generally a high secondary electron emission property; Under electron bombardment, th e secondary electron emission induces charge on the spacer. We show that th e surface of the spacer is charged positively in FED operation, which would cause an image distortion. We analyze the effect of charging on the spacer in terms of the electron density profile and luminescence profile of a dot near the spacer. Simulation results show that the image of a dot near the spacer is darker and smaller than that of a dot away from the spacer, thoug h electrons are crowded near spacers, The results are confirmed by experime nts. Finally, me suggest a may to reduce the effect of spacer charging by i ntroducing a metal strip.