J. Combet et al., STRUCTURAL AND DYNAMICAL ASPECTS OF SOLID SULPHOLAN IN THE TEMPERATURE-RANGE 160-300 K .1. X-RAY-POWDER DIFFRACTION STUDY, Physica. B, Condensed matter, 233(2-3), 1997, pp. 95-101
The X-ray diffraction study of polycrystalline sulpholan has been carr
ied out in the T = 200-300 K temperature range, in order to compare wi
th previous NMR results about the existence of two high-temperature ph
ases I and II and of two low-temperature phases III and IV. The transi
tion I-II could be evidenced by the temperature evolution of the relat
ive intensities of the observed diffraction lines. The crystalline pha
ses III and IV were identified as monoclinic, with a = 12.29(1) Angstr
om b = 10.23(1) Angstrom, c = 9.27(1) Angstrom, beta = 97.49(5)degrees
, space group P2(1)/c, Z = 8 at T = 230 K. The transition III-IV was o
bserved only as a discontinuity in the temperature evolution of lattic
e parameters.