Surface studies of the rearrangement of end groups of a polymer by ToF-SIMS and AFM

Citation
L. Li et al., Surface studies of the rearrangement of end groups of a polymer by ToF-SIMS and AFM, MACROMOLEC, 33(15), 2000, pp. 5588-5592
Citations number
25
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
MACROMOLECULES
ISSN journal
00249297 → ACNP
Volume
33
Issue
15
Year of publication
2000
Pages
5588 - 5592
Database
ISI
SICI code
0024-9297(20000725)33:15<5588:SSOTRO>2.0.ZU;2-P
Abstract
The polymer (BA-CB) was prepared by condensation polymerization of bispheno l A and 1,8-dibromooctane. The bromine atoms that were attached to the ends of the polymer chains could be used to determine the distribution of the e nd groups on the surface of BA-C8 polymer films. The surface morphology was studied using atomic force microscopy (AFM) tapping mode phase imaging. Di rect observation of the growth process of a spherulite indicates that the d iameter of the spherulite increases with time. The spatial distribution of the end group, Br, was determined by time-of-flight secondary ion mass spec trometry (ToF-SIMS) chemical imaging. For the amorphous films, a homogeneou s distribution of the end groups at the surface was found, while for the se micrystalline films the end groups rearranged and preferentially segregated at the surface of the boundaries and the eyes of the spherulites.