In the present work, we propose a simple optical method to perform profilom
etry on works of art. The method is based on the projection of a Ronchi gra
ting onto the surface to be analyzed. When viewed at an angle different fro
m the projection angle, the grid pattern appears deformed by the surface sh
ape. This pattern is digitized, by a high-resolution CCD camera, and then p
rocessed using a Fourier transform analysis. The technique is free from the
errors caused by higher harmonic components of the grating pattern. Furthe
rmore, the method relies on very simple equipment and it is therefore suita
ble for in situ measurements. Theoretical details and examples of the techn
ique in operation are given. (C) 2000 Elsevier Science Ltd. All rights rese
rved.