Theoretical analysis of abnormal grain growth in HCP-polycrystalline thin films on rigid substrates

In this paper, the effects of grain orientation on preferred abnormal grain growth in HCP-poiycrystalline thin films have been analysed with respect t o strain energy. The calculated results showed that C-hkl, the average valu es of the orientation factor, decreased with increase of 1 for the same h a nd k and increased with increase of h or/and k for constant 1. Where (hkl) denoted a particular grain orientation, that is, the grains with (hkl) plan es oriented parallel to the film surface. This is preannounced that: consid ering the strain energy solely, the grains with higher 1 and lower h and k should be favorable in HCP-polycrystalline thin films on rigid substrates a fter annealing.