Mg. Debije et al., On the efficiency of hole and electron transfer from the hydration layer to DNA: An EPR study of crystalline DNA X-irradiated at 4 K, RADIAT RES, 154(2), 2000, pp. 163-170
The aim of this project was to gain an improved understanding of how the ef
ficiency of hole and electron transfer from the solvation layer to DNA decr
eases as a function of distance from DNA. The packing of DNA in crystals of
known structure makes it possible to calculate the degree of DNA hydration
with a precision that is significantly greater than that achievable for am
orphous samples. Previous work on oligodeoxynucleotide crystals has demonst
rated that the efficiency of free radical trapping by DNA exposed to ionizi
ng radiation at 4 K is relatively insensitive to base sequence, conformatio
n, counterion, or base stacking continuity. Having eliminated these confoun
ding variables, it is now possible to ascertain the degree of radical trans
fer that occurs from ionized water as a function of DNA hydration (Gamma, i
n mol water/ mol nucleotide). EPR is used to measure the hydroxyl radical c
oncentration in crystals irradiated at 4 K. From a lack of hydroxyl radical
s trapped in the inner hydration mantle, we determine that hole transfer to
DNA is complete for water molecules located within 8 Angstrom. This corres
ponds to Gamma = 9-11 and indicates that hole transfer is 100% (as efficien
t as direct ionization of DNA) for water molecules adjacent to DNA. Beyond
similar to 8 Angstrom (Gamma > 10), hydroxyl radicals are observed; thus de
protonation of the water radical cation is seen to compete with hole transf
er to DNA as soon as one water intervenes between the ionized water and DNA
. The boundary for 0% hole transfer is projected to occur somewhere between
15 and 20 waters per nucleotide. Electron transfer, on the other hand, is
100% efficient across the entire range studied, 4.2 less than or equal to G
amma less than or equal to 15.6. (C) 2000 by Radiation Research Society.