Room temperature (H2S) gas detector of pure and doped tin oxide films were
prepared by the sol-gel method. X-ray diffraction (XRD) and Scanning Electr
on Microscope (SEM) have studied the microstructure of these films. It reve
aled that the as-prepared films show amorphous structure and ultra-fine gra
ins. The heat-treated films (773 K, 10 K/min), show a strong peak (101) bes
ides the grains are oriented over the film surface. The room temperature se
nsitivity of the films of H2S gas was detected, a fast response < 10 s, hig
h sensitivity 99% and low recovery < 5 min. The coated films with tetraethy
lorthosilicate (TEOS) show, a fast response < 10 s, high sensitivity 98%, l
ong recovery > 5 min and long age with high efficiency and reproducibility.
Some models of detectors with different shapes and the electrical circuit
were designed to detect H2S gas with high efficiency. (C) 2000 Elsevier Sci
ence S.A. All rights reserved.