Molybdenum x-ray emission spectroscopic study of vacancy-induced electronic states in V2O5-MoO3 thin films and powders

Citation
Bs. Acharya et al., Molybdenum x-ray emission spectroscopic study of vacancy-induced electronic states in V2O5-MoO3 thin films and powders, X-RAY SPECT, 29(4), 2000, pp. 279-284
Citations number
37
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
29
Issue
4
Year of publication
2000
Pages
279 - 284
Database
ISI
SICI code
0049-8246(200007/08)29:4<279:MXESSO>2.0.ZU;2-B
Abstract
X-ray emission spectra in compound thin films are scarce, although such stu dies in metals, alloys and other inorganic compounds are available. In this study, compound thin films of V2O5-MoO3 and powders of same compositions w ere investigated to see the effect of V2O5 incorporation in an MoO3 matrix. For this purpose, K beta, L alpha and L beta emissions from Mo present in these matrices were measured. The full width at half-maximum (FWHM) of L al pha(2) and L beta(1) in thin films were found to be different from that of powders. Most of these emission bands show a low asymmetry index before the se are split into separate hands. All these findings have been explained on the basis of vacancy production, core hole lifetime, crystal structure and stoichiometric variation of MoO3 in the V2O5 matrix. Copyright (C) 2000 Jo hn Wiley & Sons, Ltd.