The oxygen durability of poly(methylphenylsilane) (PMPS) in photoconduction
has been improved by the use of copolysilanes with disiloxane-pendant grou
ps. X-ray photoelectron spectroscopy analysis shows that disiloxane groups
of the copolysilanes accumulate on their top-most surface at a much higher
concentration than the bulk disiloxane concentration. The preferential cove
rage of disiloxane groups on the surface evidently leads to formation of a
highly oxygen durable surface. The hole drift mobility of the charge carrie
rs in copolysilanes with 5 mol % of disiloxane-pendant groups is over 10(-4
) cm(2) V-1 s(-1) at E>10(5) V cm(-1), almost comparable to that of PMPS. I
t was noted that the practical Xerographic potential decay was stabilized b
y the copolysilanes, while PMPS deteriorated after oxygen exposure. (C) 200
0 American Institute of Physics. [S0003-6951(00)04931-7].