Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films

Citation
R. Castro-rodriguez et al., Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films, APPL SURF S, 161(3-4), 2000, pp. 340-346
Citations number
36
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
161
Issue
3-4
Year of publication
2000
Pages
340 - 346
Database
ISI
SICI code
0169-4332(200007)161:3-4<340:EOITOS>2.0.ZU;2-#
Abstract
Indium tin oxide (ITO) coatings of glass substrates were etched with hydroc hloric acid in order to obtain different root-mean-square roughness (R-ITO) on its surface. The effect of R-ITO on the morphology, structural and opti cal properties of CdS films deposited was investigated. Polycrystalline cad mium sulfide thin films were deposited on ITO/glass substrates by chemical- bath deposition (CBD) at 358 K, and studied by atomic force microscopy (AFM ). Roughness of CdS films (R-CdS) showed a nearly linear increase with R-IT O. The thickness of CdS films was investigated by Auger Electron Spectrosco py (AES) and showed an increment with R-CdS. X-ray diffraction results show ed that CdS films have a cubic zincblende structure with a(lll) preferred o rientation. The measured residual strain of the CdS films showed an initial increse with R-ITO reaching a maximum point at 15 +/- 2 nm, and after that exhibited a decreasing dependence. The optical band gap E-o of the CdS fil ms obtained from transmittance measurements did not depend on R-ITO. (C) 20 00 Elsevier Science B.V. All rights reserved.